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Quantitative X-ray diffraction analysis of oxides formed on superalloysMethods were developed for quantitative analysis by X-ray diffraction of the oxides Al2O3, NiO, Cr2O3, CoO, and CoCr2O4 within a standard deviation of about 10 percent of the weight fraction reported or within 1 percent absolute. These error limits assume that the sample oxides are well characterized and that the physiochemical structure of the oxides in the samples are identical with those in the synthesized standards. Results are given for the use of one of the techniques in the analysis of spalls from a series of oxidation tests of the cobalt base alloy WI-52.
Document ID
19720022853
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Garlick, R. G.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 2, 2013
Publication Date
September 1, 1972
Subject Category
Materials, Nonmetallic
Report/Patent Number
NASA-TM-X-2627
E-6911
Report Number: NASA-TM-X-2627
Report Number: E-6911
Accession Number
72N30503
Funding Number(s)
PROJECT: RTOP 134-03
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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