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Study on the effect of contamination on the performance of X-ray telescopesModifications were made to the X-ray reflectometer located at the Space Sciences Laboratory, Marshall Space Flight Center. One was an automatic drive for the Large Micrometer Head. This system, interfaced with the Hewlett Packard Computer System, is used to record data and provides the X-ray reflectometer with an automated data-taking capability. Using this system, a complete scatter curve can be obtained automatically. Previously, it was necessary to manually reset the system after recording for each data point in the scatter curve. The second modification provided an externally controlled electrical drive to move the microfocus X-ray source along its axis. With this modification, one can translate the X-ray source while it is operating to locate the position providing maximum count rate.
Document ID
19740023796
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Neal, W. R.
(Visidyne, Inc. Burlington, MA, United States)
Reidy, W. P.
(Visidyne, Inc. Burlington, MA, United States)
Date Acquired
September 3, 2013
Publication Date
September 24, 1973
Subject Category
Instrumentation And Photography
Report/Patent Number
VI-199
NASA-CR-120323
Report Number: VI-199
Report Number: NASA-CR-120323
Accession Number
74N31909
Funding Number(s)
CONTRACT_GRANT: NAS8-28083
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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