Study to improve the low frequency noise characteristics of (Hg,Cd)Te detectors

Efforts made to identify and reduce the sources of l/f noise in 15 micron n-type (Hg,Cd)Te detectors operating at 77 K are reported. The investigation covered: evaluation of the influence of material properties and detector processing techniques, determination of the relative importance of surfaces, volumes, regions, and contracts, and generation of theoretical models for guidance of the experimental work.