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Electromagnetic radiation screening of microcircuits for long life applicationsThe utility of X-rays as a stimulus for screening high reliability semiconductor microcircuits was studied. The theory of the interaction of X-rays with semiconductor materials and devices was considered. Experimental measurements of photovoltages, photocurrents, and effects on specified parameters were made on discrete devices and on microcircuits. The test specimens included discrete devices with certain types of identified flaws and symptoms of flaws, and microcircuits exhibiting deviant electrical behavior. With a necessarily limited sample of test specimens, no useful correlation could be found between the X-ray-induced electrical response and the known or suspected presence of flaws.
Document ID
19750002239
Document Type
Contractor Report (CR)
Authors
Brammer, W. G. (Hughes Aircraft Co. Culver City, CA, United States)
Erickson, J. J. (Hughes Aircraft Co. Culver City, CA, United States)
Levy, M. E. (Hughes Aircraft Co. Culver City, CA, United States)
Date Acquired
September 3, 2013
Publication Date
October 1, 1974
Subject Category
ELECTRONICS AND ELECTRICAL ENGINEERING
Report/Patent Number
HAC-REF-D0573
P74-438
NASA-CR-120512
Funding Number(s)
CONTRACT_GRANT: NAS8-30373
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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