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Apparatus description and data analysis of a radiometric technique for measurements of spectral and total normal emittanceThe development of a radiometric technique for determining the spectral and total normal emittance of materials heated to temperatures of 800, 1100, and 1300 K by direct comparison with National Bureau of Standards (NBS) reference specimens is discussed. Emittances are measured over the spectral range of 1 to 15 microns and are statistically compared with NBS reference specimens. Results are included for NBS reference specimens, Rene 41, alundum, zirconia, AISI type 321 stainless steel, nickel 201, and a space-shuttle reusable surface insulation.
Document ID
19750007880
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Technical Note (TN)
Authors
Edwards, S. F.
(NASA Langley Research Center Hampton, VA, United States)
Kantsios, A. G.
(NASA Langley Research Center Hampton, VA, United States)
Voros, J. P.
(NASA Langley Research Center Hampton, VA, United States)
Stewart, W. F.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
February 1, 1975
Subject Category
Instrumentation And Photography
Report/Patent Number
L-9774
NASA-TN-D-7798
Accession Number
75N15952
Funding Number(s)
PROJECT: RTOP 502-37-02-03
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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