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Precision compliance techniques for slow crack growth measurementsA method is presented for using simple electronic components to obtain the high sensitivity needed to measure very slow crack growth rates. The technique presented can reduce the experimental time considerably and also yield a greater amount of data more accurately than optical techniques for measuring crack growth rates.
Document ID
19750008718
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Noronha, P. J. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 3, 2013
Publication Date
January 10, 1975
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-X-64904
Report Number: NASA-TM-X-64904
Accession Number
75N16790
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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