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Programs for calculating cell parameters in electron and X-ray diffractionTen programs for calculating cell parameters from single crystal electron diffraction patterns are presented. Most of the programs, written for use with a programmable desk calculator, are also applicable to X-ray diffraction work. The programs can be used to calculate d-spacings from electron diffraction plate measurements, and to determine cell data (including interplanar angles and zone angles) for all crystal systems. A program for rhombohedral-hexagonal conversions and one for matching crystal data from standards with apparent crystal parameters found in diffraction patterns are included. Because they allow rapid determination of data not present in X-ray listings or elsewhere in the literature, the programs facilitate identification of unknowns.
Document ID
19790022673
Acquisition Source
Legacy CDMS
Document Type
Technical Publication (TP)
Authors
Polkowski, G.
(LFE Corp. Richmond, Calif., United States)
Snetsinger, K. G.
(NASA Ames Research Center Moffett Field, CA, United States)
Farlow, N. H.
(NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
August 9, 2013
Publication Date
August 1, 1979
Subject Category
Environment Pollution
Report/Patent Number
A-7761
NASA-TP-1529
Accession Number
79N30844
Funding Number(s)
PROJECT: RTOP 198-10-05
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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