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Analysis of the Effects of Impurities in SiliconA solar cell fabrication and analysis program to determine the effects on the resultant solar cell efficiency of impurities incorporated into silicon is conducted. Flight quality technologies and quality assurance are employed to assure that variations in cell performance are due to the impurities incorporated in the silicon. The type and level of impurity doping in each test lot is given and the mechanism responsible for the degradation of cell performance is identified and correlated to the doped impurities.
Document ID
19790025392
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Wohlgemuth, J. H.
(Solarex Corp. Rockville, MD, United States)
Lafky, W. M.
(Solarex Corp. Rockville, MD, United States)
Burkholder, J. H.
(Solarex Corp. Rockville, MD, United States)
Date Acquired
September 3, 2013
Publication Date
July 31, 1979
Subject Category
Energy Production And Conversion
Report/Patent Number
DOE/JPL-955307-79/2
NASA-CR-162350
Report Number: DOE/JPL-955307-79/2
Report Number: NASA-CR-162350
Accession Number
79N33563
Funding Number(s)
CONTRACT_GRANT: JPL-955307
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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