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Growth/reflectance model interface for wheat and corresponding modelThe use of modeling to explore the possibility of discovering new and useful crop condition indicators which might be available from the Thematic Mapper and to connect these symptoms to the biological causes in the crop is discussed. A crop growth model was used to predict the day to day growth features of the crop as it responds biologically to the various environmental factors. A reflectance model was used to predict the character of the interaction of daylight with the predicted growth features. An atmospheric path radiance was added to the reflected daylight to simulate the radiance appearing at the sensor. Finally, the digitized data sent to a ground station were calculated. The crop under investigation is wheat.
Document ID
19850007960
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Suits, G. H.
(Environmental Research Inst. of Michigan Ann Arbor, MI, United States)
Sieron, R.
(Environmental Research Inst. of Michigan Ann Arbor, MI, United States)
Odenweller, J.
(Environmental Research Inst. of Michigan Ann Arbor, MI, United States)
Date Acquired
September 5, 2013
Publication Date
December 1, 1984
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
NASA-CR-174230
ERIM-166500-4-F
NAS 1.26:174230
E85-10058
Report Number: NASA-CR-174230
Report Number: ERIM-166500-4-F
Report Number: NAS 1.26:174230
Report Number: E85-10058
Accession Number
85N16269
Funding Number(s)
CONTRACT_GRANT: NAS5-83
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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