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Sensitivity analysis for solar platesEconomic evaluation methods and analyses of emerging photovoltaic (PV) technology since 1976 was prepared. This type of analysis was applied to the silicon research portion of the PV Program in order to determine the importance of this research effort in relationship to the successful development of commercial PV systems. All four generic types of PV that use silicon were addressed: crystal ingots grown either by the Czochralski method or an ingot casting method; ribbons pulled directly from molten silicon; an amorphous silicon thin film; and use of high concentration lenses. Three technologies were analyzed: the Union Carbide fluidized bed reactor process, the Hemlock process, and the Union Carbide Komatsu process. The major components of each process were assessed in terms of the costs of capital equipment, labor, materials, and utilities. These assessments were encoded as the probabilities assigned by experts for achieving various cost values or production rates.
Document ID
19860017212
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Aster, R. W.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 12, 2013
Publication Date
February 1, 1986
Publication Information
Publication: Proceedings of the Flat-Plate Solar Array Project Workshop on Low-Cost Polysilicon for Terrestrial Photovoltaic Solar-Cell Applications
Subject Category
Energy Production And Conversion
Accession Number
86N26684
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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