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Measurement of the properties of lossy materials inside a finite conducting cylinderBroadband, swept frequency measurement techniques were investigated for the evaluation of the electrical performance of thin, high temperature material coatings. Reflections and transmission measurements using an HP8510B Network Analyzer were developed for an existing high temperature test rig at NASA Lewis Research Center. Reflection measurements will be the initial approach used due to fixture simplicity even though surface wave transmission measurements would be more sensitive. The minimum goal is to monitor the electrical change of the material's performance as a function of temperature. If possible, the materials constitutive parameters, epsilon and muon will be found.
Document ID
19880011578
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Dominek, A.
(Ohio State Univ. Columbus, OH, United States)
Park, A.
(Ohio State Univ. Columbus, OH, United States)
Caldecott, R.
(Ohio State Univ. Columbus, OH, United States)
Date Acquired
September 5, 2013
Publication Date
March 1, 1988
Subject Category
Physics (General)
Report/Patent Number
NASA-CR-182664
NAS 1.26:182664
ESL-719300-1
Accession Number
88N20962
Funding Number(s)
CONTRACT_GRANT: NAG3-784
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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