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Two-dimensional high temperature optical strain measurement system, phase 2A laser speckle strain measurement system with two-dimensional measurement capabilities has been built and tested for high temperature applications. The 1st and 2nd principle strains at a point on a specimen are calculated from three components of one-dimensional strain. Strain components are detected by cross-correlating reference and shifted speckle patterns recorded before and after straining the specimen. Speckle patterns are recorded by a linear photodiode array camera. Accurate strains have been measured at temperatures up to 650 C. Stable speckle correlations and linear stress-strain relations have been demonstrated up to 750 C. The resolution of the system is 15 microstrains, with a gauge length less than 1 mm.
Document ID
19890016847
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Lant, Christian T.
(Sverdrup Technology, Inc. Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
July 1, 1989
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.26:185116
E-4923
NASA-CR-185116
Report Number: NAS 1.26:185116
Report Number: E-4923
Report Number: NASA-CR-185116
Accession Number
89N26218
Funding Number(s)
PROJECT: RTOP 582-01-11
CONTRACT_GRANT: NAS3-25266
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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