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Foundations of measurement and instrumentationThe user of instrumentation has provided an understanding of the factors that influence instrument performance, selection, and application, and of the methods of interpreting and presenting the results of measurements. Such understanding is prerequisite to the successful attainment of the best compromise among reliability, accuracy, speed, cost, and importance of the measurement operation in achieving the ultimate goal of a project. Some subjects covered are dimensions; units; sources of measurement error; methods of describing and estimating accuracy; deduction and presentation of results through empirical equations, including the method of least squares; experimental and analytical methods of determining the static and dynamic behavior of instrumentation systems, including the use of analogs.
Document ID
19900012035
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Reference Publication (RP)
Authors
Warshawsky, Isidore
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
April 1, 1990
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.61:1222
NASA-RP-1222
E-3786
Accession Number
90N21351
Funding Number(s)
PROJECT: RTOP 505-62-01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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