Photoclinometric analysis of wrinkle ridges on Lunae Planum, Mars

Wrinkle ridges are common morphologic features on Mars. Both volcanic and tectonic mechanisms were suggested to explain their origin; recent work has focused on a compressional origin. Analysis of terrestrial analogs has greatly influenced and aided the understanding of wrinkle ridge formation. An important aspect necessary to intrepret structure is topography. Topographic profiles across ridges can provide important constraints for models of internal structure and analyzing deformation associated with ridges. Topographic maps of Mars are too coarse to resolve the topography of individual ridges; therefore, monoscopic photoclinometry was used to derive topographic profiles for the ridges. Profiles spaced a few kilometers apart were obtained for each ridge, the number depended on ridge length, morphology, and albedo variation. Photoclinometry relies on pixel brightness variations which results from topography, albedo, or both. Because of the albedo variations, photoclimometric profiles can not be extended across large distances, such as between adjacent ridges (about 20 to 80 km). However, the technique is applicable to shorter distances, such as the distance across typical ridges. Profiles were measured across the ridge and extended a few kilometers on either side, including all visible components of the ridge. The results of these measurements and the use of internal structure and topographic profile models for estimating the shortening due to folding and faulting are discussed.