NTRS - NASA Technical Reports Server

Back to Results
Contamination control engineering design guidelines for the aerospace communityThermal control surfaces, solar arrays, and optical devices may be adversely affected by a small quantity of molecular and/or particulate contamination. What is rarely discussed is how one: (1) quantifies the level of contamination that must be maintained in order for the system to function properly, and (2) enforces contamination control to ensure compliance with requirements. This document is designed to address these specific issues and is intended to serve as a handbook on contamination control for the reader, illustrating process and methodology while providing direction to more detailed references when needed. The effects of molecular contamination on reflecting and transmitting surfaces are examined and quantified in accordance with MIL STD 1246C. The generation, transportation, and deposition of molecular contamination is reviewed and specific examples are worked to illustrate the process a design engineer can use to estimate end of life cleanliness levels required by solar arrays, thermal control surfaces, and optical surfaces. A similar process is used to describe the effect of particulate contamination as related to percent area coverage (PAC) and bi-directional reflectance distribution function (BRDF). Relationships between PAC and surface cleanliness, which include the effects of submicron sized particles, are developed and BRDF is related to specific sensor design parameters such as Point Source Transmittance (PST). The pros and cons of various methods of preventing, monitoring, and cleaning surfaces are examined and discussed.
Document ID
Acquisition Source
Goddard Space Flight Center
Document Type
Contractor Report (CR)
Tribble, A. C.
(Rockwell International Corp. Downey, CA United States)
Boyadjian, B.
(Rockwell International Corp. Downey, CA United States)
Davis, J.
(Rockwell International Corp. Downey, CA United States)
Haffner, J.
(Rockwell International Corp. Downey, CA United States)
McCullough, E.
(Rockwell International Corp. Downey, CA United States)
Date Acquired
September 6, 2013
Publication Date
May 1, 1996
Subject Category
Engineering (General)
Report/Patent Number
NAS 1.26:4740
Accession Number
Funding Number(s)
Distribution Limits
Work of the US Gov. Public Use Permitted.
No Preview Available