Acquisition Source
Marshall Space Flight Center
Document Type
Reprint (Version printed in journal)
Authors
Hoover, Richard B. (NASA Marshall Space Flight Center Huntsville, AL United States) Johnson, R. Barry (Optical ETC, Inc. Huntsville, AL United States) Fineschi, Silvano (Harvard-Smithsonian Center for Astrophysics Cambridge, MA United States) Walker, Arthur B. C., Jr. (Stanford Univ. Stanford, CA United States) Baker, Phillip C. (Baker Consulting Walnut Creek, CA United States) Zukic , Muamer (Alabama Univ. Huntsville, AL United States) Kim, Jongmin (Alabama Univ. Huntsville, AL United States) Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: International Society for Optical Engineering
Publisher: Society of Photo-Optical Instrumentation Engineers
Volume: 1742
ISBN: 0-8194-0915-4
Report/Patent Number
NASA/TM-1992-113081NAS 1.15:113081Report Number: NASA/TM-1992-113081Report Number: NAS 1.15:113081ISBN: 0-8194-0915-4 Meeting Information
Meeting: Multilayer and Grazing Incidence X-ray/EUV Optics for Astronomy and Projection Lithography
Location: San Diego, CA
Country: United States
Start Date: July 19, 1992
End Date: July 22, 1992
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.