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Single-Event Effects Ground Testing and On-Orbit Rate Prediction Methods: The Past, Present and FutureOver the past 27 years, or so, increased concern over single event effects in spacecraft systems has resulted in research, development and engineering activities centered around a better understanding of the space radiation environment, single event effects predictive methods, ground test protocols, and test facility developments. This research has led to fairly well developed methods for assessing the impact of the space radiation environment on systems that contain SEE sensitive devices and the development of mitigation strategies either at the system or device level.
Document ID
20030053172
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Reed, Robert A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kinnison, Jim
(Johns Hopkins Univ. Laurel, MD, United States)
Pickel, Jim
(PR and T, Inc. Fallbrook, CA, United States)
Buchner, Stephen
(QSS Group, Inc. Seabrook, MD, United States)
Marshall, Paul W.
(QSS Group, Inc. Seabrook, MD, United States)
Kniffin, Scott
(Raytheon Information Technology and Scientific Services Greenbelt, MD, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2003
Subject Category
Space Radiation
Meeting Information
Meeting: 2003 IEEE Nuclear and Space Radiation Effects Conference
Country: Unknown
Start Date: July 21, 2003
End Date: July 25, 2003
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.
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