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Advanced Image Processing for Defect Visualization in Infrared ThermographyResults of a defect visualization process based on pulse infrared thermography are presented. Algorithms have been developed to reduce the amount of operator participation required in the process of interpreting thermographic images. The algorithms determine the defect's depth and size from the temporal and spatial thermal distributions that exist on the surface of the investigated object following thermal excitation. A comparison of the results from thermal contrast, time derivative, and phase analysis methods for defect visualization are presented. These comparisons are based on three dimensional simulations of a test case representing a plate with multiple delaminations. Comparisons are also based on experimental data obtained from a specimen with flat bottom holes and a composite panel with delaminations.
Document ID
20040110685
Acquisition Source
Langley Research Center
Document Type
Other
Authors
Plotnikov, Yuri A.
(NASA Langley Research Center Hampton, VA, United States)
Winfree, William P.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 1997
Subject Category
Instrumentation And Photography
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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