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Taguchi Approach to Design Optimization for Quality and Cost: An OverviewCalibrations to existing cost of doing business in space indicate that to establish human presence on the Moon and Mars with the Space Exploration Initiative (SEI) will require resources, felt by many, to be more than the national budget can afford. In order for SEI to succeed, we must actually design and build space systems at lower cost this time, even with tremendous increases in quality and performance requirements, such as extremely high reliability. This implies that both government and industry must change the way they do business. Therefore, new philosophy and technology must be employed to design and produce reliable, high quality space systems at low cost. In recognizing the need to reduce cost and improve quality and productivity, Department of Defense (DoD) and National Aeronautics and Space Administration (NASA) have initiated Total Quality Management (TQM). TQM is a revolutionary management strategy in quality assurance and cost reduction. TQM requires complete management commitment, employee involvement, and use of statistical tools. The quality engineering methods of Dr. Taguchi, employing design of experiments (DOE), is one of the most important statistical tools of TQM for designing high quality systems at reduced cost. Taguchi methods provide an efficient and systematic way to optimize designs for performance, quality, and cost. Taguchi methods have been used successfully in Japan and the United States in designing reliable, high quality products at low cost in such areas as automobiles and consumer electronics. However, these methods are just beginning to see application in the aerospace industry. The purpose of this paper is to present an overview of the Taguchi methods for improving quality and reducing cost, describe the current state of applications and its role in identifying cost sensitive design parameters.
Document ID
20040121019
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Unal, Resit
(NASA Langley Research Center Hampton, VA, United States)
Dean, Edwin B.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 1990
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: 1991 Annual Conference of the International Society of Parametric Analysts
Country: United States
Start Date: January 1, 1991
Sponsors: International Society of Parametric Analysts
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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