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High-Accuracy Surface Figure Measurement of Silicon Mirrors at 80 KThis report describes the equipment, experimental methods, and first results at a new facility for interferometric measurement of cryogenically-cooled spherical mirrors at the Goddard Space Flight Center Optics Branch. The procedure, using standard phase-shifting interferometry, has an standard combined uncertainty of 3.6 nm rms in its representation of the two-dimensional surface figure error at 80, and an uncertainty of plus or minus 1 nm in the rms statistic itself. The first mirror tested was a concave spherical silicon foam-core mirror, with a clear aperture of 120 mm. The optic surface was measured at room temperature using standard absolute techniques; and then the change in surface figure error from room temperature to 80 K was measured. The mirror was cooled within a cryostat. and its surface figure error measured through a fused-silica window. The facility and techniques will be used to measure the surface figure error at 20K of prototype lightweight silicon carbide and Cesic mirrors developed by Galileo Avionica (Italy) for the European Space Agency (ESA).
Document ID
20040171482
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Blake, Peter
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Mink, Ronald G.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Chambers, John
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Davila, Pamela
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Robinson, F. David
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2004
Subject Category
Optics
Meeting Information
Meeting: SPIE Conference
Location: Glasgow, Scotland
Country: United Kingdom
Start Date: June 19, 2004
End Date: June 25, 2004
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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