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development of an extra-vehicular (eva) infrared (ir) camera inspection systemDesigned to fulfill a critical inspection need for the Space Shuttle Program, the EVA IR Camera System can detect crack and subsurface defects in the Reinforced Carbon-Carbon (RCC) sections of the Space Shuttle s Thermal Protection System (TPS). The EVA IR Camera performs this detection by taking advantage of the natural thermal gradients induced in the RCC by solar flux and thermal emission from the Earth. This instrument is a compact, low-mass, low-power solution (1.2cm3, 1.5kg, 5.0W) for TPS inspection that exceeds existing requirements for feature detection. Taking advantage of ground-based IR thermography techniques, the EVA IR Camera System provides the Space Shuttle program with a solution that can be accommodated by the existing inspection system. The EVA IR Camera System augments the visible and laser inspection systems and finds cracks and subsurface damage that is not measurable by the other sensors, and thus fills a critical gap in the Space Shuttle s inspection needs. This paper discusses the on-orbit RCC inspection measurement concept and requirements, and then presents a detailed description of the EVA IR Camera System design.
Document ID
20060016499
Document Type
Conference Paper
Authors
Gazarik, Michael
(NASA Langley Research Center Hampton, VA, United States)
Johnson, Dave
(NASA Langley Research Center Hampton, VA, United States)
Kist, Ed
(NASA Langley Research Center Hampton, VA, United States)
Novak, Frank
(NASA Langley Research Center Hampton, VA, United States)
Antill, Charles
(NASA Langley Research Center Hampton, VA, United States)
Haakenson, David
(NASA Langley Research Center Hampton, VA, United States)
Howell, Patricia
(NASA Langley Research Center Hampton, VA, United States)
Pandolf, John
(NASA Langley Research Center Hampton, VA, United States)
Jenkins, Rusty
(NASA Langley Research Center Hampton, VA, United States)
Yates, Rusty
(NASA Johnson Space Center Houston, TX, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2006
Subject Category
Instrumentation and Photography
Report/Patent Number
SPIE 6205-51
Meeting Information
SPIE Defense and Security Symposium(Orlando, FL)
Funding Number(s)
OTHER: 769-06-04-02-02-16
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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