NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
High Temperature Electronics for Intelligent Harsh Environment SensorsThe development of intelligent instrumentation systems is of high interest in both public and private sectors. In order to obtain this ideal in extreme environments (i.e., high temperature, extreme vibration, harsh chemical media, and high radiation), both sensors and electronics must be developed concurrently in order that the entire system will survive for extended periods of time. The semiconductor silicon carbide (SiC) has been studied for electronic and sensing applications in extreme environment that is beyond the capability of conventional semiconductors such as silicon. The advantages of SiC over conventional materials include its near inert chemistry, superior thermomechanical properties in harsh environments, and electronic properties that include high breakdown voltage and wide bandgap. An overview of SiC sensors and electronics work ongoing at NASA Glenn Research Center (NASA GRC) will be presented. The main focus will be two technologies currently being investigated: 1) harsh environment SiC pressure transducers and 2) high temperature SiC electronics. Work highlighted will include the design, fabrication, and application of SiC sensors and electronics, with recent advancements in state-of-the-art discussed as well. These combined technologies are studied for the goal of developing advanced capabilities for measurement and control of aeropropulsion systems, as well as enhancing tools for exploration systems.
Document ID
20080033116
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
Evans, Laura J.
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
August 24, 2013
Publication Date
May 8, 2008
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 54th International Instrumentation Symposium
Location: Florida
Country: United States
Start Date: May 5, 2008
End Date: May 8, 2008
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available