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Processing and Probability Analysis of Pulsed Terahertz NDE of Corrosion under Shuttle Tile DataThis paper examines data processing and probability analysis of pulsed terahertz NDE scans of corrosion defects under a Shuttle tile. Pulsed terahertz data collected from an aluminum plate with fabricated corrosion defects and covered with a Shuttle tile is presented. The corrosion defects imaged were fabricated by electrochemically etching areas of various diameter and depth in the plate. In this work, the aluminum plate echo signal is located in the terahertz time-of-flight data and a threshold is applied to produce a binary image of sample features. Feature location and area are examined and identified as corrosion through comparison with the known defect layout. The results are tabulated with hit, miss, or false call information for a probability of detection analysis that is used to identify an optimal processing threshold.
Document ID
20090012431
Document Type
Conference Paper
Authors
Anastasi, Robert F.
(NASA Langley Research Center Hampton, VA, United States)
Madaras, Eric I.
(NASA Langley Research Center Hampton, VA, United States)
Seebo, Jeffrey P.
(NASA Langley Research Center Hampton, VA, United States)
Ely, Thomas M.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 24, 2013
Publication Date
March 8, 2009
Subject Category
Quality Assurance And Reliability
Report/Patent Number
LF99-7554
Meeting Information
SPIE Smart Structures/NDE 2009(California)
Distribution Limits
Public
Copyright
Public Use Permitted.

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