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Physical and Electrical Characterization of Aluminum Polymer CapacitorsPolymer aluminum capacitors from several manufacturers with various combinations of capacitance, rated voltage, and ESR values were physically examined and electrically characterized. The physical construction analysis of the capacitors revealed three different capacitor structures, i.e., traditional wound, stacked, and laminated. Electrical characterization results of polymer aluminum capacitors are reported for frequency-domain dielectric response at various temperatures, surge breakdown voltage, and other dielectric properties. The structure-property relations in polymer aluminum capacitors are discussed.
Document ID
20100015162
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Liu, David
(MEI Technologies, Inc. Greenbelt, MD, United States)
Sampson, Michael J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
March 15, 2010
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Capacitors and Resistors Technology Symposium (CARTS) Conference
Location: New Orleans, LA
Country: United States
Start Date: March 15, 2010
End Date: March 18, 2010
Distribution Limits
Public
Copyright
Public Use Permitted.
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