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Accelerated Aging System for Prognostics of Power Semiconductor DevicesPrognostics is an engineering discipline that focuses on estimation of the health state of a component and the prediction of its remaining useful life (RUL) before failure. Health state estimation is based on actual conditions and it is fundamental for the prediction of RUL under anticipated future usage. Failure of electronic devices is of great concern as future aircraft will see an increase of electronics to drive and control safety-critical equipment throughout the aircraft. Therefore, development of prognostics solutions for electronics is of key importance. This paper presents an accelerated aging system for gate-controlled power transistors. This system allows for the understanding of the effects of failure mechanisms, and the identification of leading indicators of failure which are essential in the development of physics-based degradation models and RUL prediction. In particular, this system isolates electrical overstress from thermal overstress. Also, this system allows for a precise control of internal temperatures, enabling the exploration of intrinsic failure mechanisms not related to the device packaging. By controlling the temperature within safe operation levels of the device, accelerated aging is induced by electrical overstress only, avoiding the generation of thermal cycles. The temperature is controlled by active thermal-electric units. Several electrical and thermal signals are measured in-situ and recorded for further analysis in the identification of leading indicators of failures. This system, therefore, provides a unique capability in the exploration of different failure mechanisms and the identification of precursors of failure that can be used to provide a health management solution for electronic devices.
Document ID
20110011744
Document Type
Conference Paper
Authors
Celaya, Jose R. (SGT, Inc. Moffett Field, CA, United States)
Vashchenko, Vladislav (National Semiconductor Corp. Santa Clara, CA, United States)
Wysocki, Philip (ASRC Aerospace Corp. Moffett Field, CA, United States)
Saha, Sankalita (MCT, Inc. Moffett Field, CA, United States)
Date Acquired
August 25, 2013
Publication Date
September 13, 2010
Subject Category
Avionics and Aircraft Instrumentation
Report/Patent Number
ARC-E-DAA-TN2078
Meeting Information
IEEE Autotestcon 2010(Orlando, FL)
Funding Number(s)
CONTRACT_GRANT: NNA08CG83C
Distribution Limits
Public
Copyright
Public Use Permitted.

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