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Radiation and Reliability Concerns for Modern Nonvolatile Memory TechnologyCommercial nonvolatile memory technology is attractive for space applications, but radiation issues are serious concerns. In addition, we discuss combined radiation/reliability concerns which are only beginning to be addressed.
Document ID
20110023046
Document Type
Conference Paper
Authors
Oldham, Timothy R. (Dell Services Federal Government, Inc. Fairfax, VA, United States)
Friendlich, Mark R. (MEI Technologies, Inc. Lanham, MD, United States)
Kim, Hak S. (MEI Technologies, Inc. Lanham, MD, United States)
Berg, Melanie D. (MEI Technologies, Inc. Lanham, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Buchner, S. P. (Naval Research Lab. Washington, DC, United States)
McMorrow, D. (Naval Research Lab. Washington, DC, United States)
Mavis, D. G. (Microelectronics Research Development Corp. Albuquerque, NM, United States)
Eaton, P. H. (Microelectronics Research Development Corp. Albuquerque, NM, United States)
Castillo, J. (Microelectronics Research Development Corp. Albuquerque, NM, United States)
Date Acquired
August 25, 2013
Publication Date
January 1, 2011
Subject Category
Computer Systems
Report/Patent Number
GSFC.O.5278.2011
Distribution Limits
Public
Copyright
Public Use Permitted.

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