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High Resolution X-Ray Micro-CT of Ultra-Thin Wall Space ComponentsA high resolution micro-CT system has been assembled and is being used to provide optimal characterization for ultra-thin wall space components. The Glenn Research Center NDE Sciences Team, using this CT system, has assumed the role of inspection vendor for the Advanced Stirling Convertor (ASC) project at NASA. This article will discuss many aspects of the development of the CT scanning for this type of component, including CT system overview; inspection requirements; process development, software utilized and developed to visualize, process, and analyze results; calibration sample development; results on actual samples; correlation with optical/SEM characterization; CT modeling; and development of automatic flaw recognition software. Keywords: Nondestructive Evaluation, NDE, Computed Tomography, Imaging, X-ray, Metallic Components, Thin Wall Inspection
Document ID
20120016713
Document Type
Conference Paper
Authors
Roth, Don J.
(NASA Glenn Research Center Cleveland, OH, United States)
Rauser, R. W.
(Toledo Univ. Toledo, OH, United States)
Bowman, Randy R.
(NASA Glenn Research Center Cleveland, OH, United States)
Bonacuse, Peter
(NASA Glenn Research Center Cleveland, OH, United States)
Martin, Richard E.
(Cleveland State Univ. Cleveland, OH, United States)
Locci, I. E.
(Toledo Univ. Toledo, OH, United States)
Kelley, M.
(Neural ID Redwood City, CA, United States)
Date Acquired
August 26, 2013
Publication Date
August 20, 2012
Subject Category
Computer Programming And Software
Report/Patent Number
E-18527
GRC-E-DAA-TN5829
Meeting Information
QNDE 2012(Denver, CO)
Funding Number(s)
WBS: WBS 138494.05.02.04.03
TASK: NNC07TA68T
TASK: NNC07TA75T
Distribution Limits
Public
Copyright
Public Use Permitted.

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