NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Measurement Decision Risk - The Importance of DefinitionsOne of the more misunderstood areas of metrology is the Test Uncertainty Ratio (TUR) and the Test Accuracy Ratio (TAR). There have been many definitions over the years, but why are these definitions important to a discussion on measurement decision risk? The importance lies in the clarity of communication. Problems can immediately arise in the application (or misapplication) of the definition of these terms. In other words, while it is important to understand the definitions, it is more important to understand concepts behind the definitions and to be precise in how they are applied. The objective of any measurement is a decision. Measurement Decision Risk is a way to look at the quality of a measurement, and although it is not a new concept, it has generated a lot of attention since its addition as a requirement in the new U.S. National Standard, ANSIINCSL Z540.3-2006. In addition to Measurement Decision Risk as the prime method of managing measurement risk, Z540.3 has added, as a fall-back, an explicit definition for TUR. The impact these new requirements may have on calibration service providers has become the topic of much discussion and in some cases concern. This paper will look at the concepts behind the definitions and how they relate to Measurement Decision Risk. Using common examples, this paper will also provide a comparison of various elements of risk related to measurement science using the concepts of TAR, TUR, accuracy ratios, and Consumer Risk (False Accept Risk). The goal of this paper is to provide a better understanding of their relevance to the measurement decision process.
Document ID
20130012508
Acquisition Source
Kennedy Space Center
Document Type
Conference Paper
Authors
Mimbs, Scott M.
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Date Acquired
August 27, 2013
Publication Date
March 10, 2008
Subject Category
Engineering (General)
Report/Patent Number
KSC-2008-056
Report Number: KSC-2008-056
Meeting Information
Meeting: 2008 Measurement Science Conference
Location: Anaheim, CA
Country: United States
Start Date: March 10, 2008
End Date: March 14, 2008
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available