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Flash Infrared Thermography Contrast Data Analysis TechniqueThis paper provides information on an IR Contrast technique that involves extracting normalized contrast versus time evolutions from the flash thermography inspection infrared video data. The analysis calculates thermal measurement features from the contrast evolution. In addition, simulation of the contrast evolution is achieved through calibration on measured contrast evolutions from many flat-bottom holes in the subject material. The measurement features and the contrast simulation are used to evaluate flash thermography data in order to characterize delamination-like anomalies. The thermal measurement features relate to the anomaly characteristics. The contrast evolution simulation is matched to the measured contrast evolution over an anomaly to provide an assessment of the anomaly depth and width which correspond to the depth and diameter of the equivalent flat-bottom hole (EFBH) similar to that used as input to the simulation. A similar analysis, in terms of diameter and depth of an equivalent uniform gap (EUG) providing a best match with the measured contrast evolution, is also provided. An edge detection technique called the half-max is used to measure width and length of the anomaly. Results of the half-max width and the EFBH/EUG diameter are compared to evaluate the anomaly. The information provided here is geared towards explaining the IR Contrast technique. Results from a limited amount of validation data on reinforced carbon-carbon (RCC) hardware are included in this paper.
Document ID
Document Type
Other - Patent
Koshti, Ajay
(NASA Johnson Space Center Houston, TX, United States)
Date Acquired
October 2, 2014
Publication Date
September 18, 2014
Subject Category
Instrumentation And Photography
Report/Patent Number
Distribution Limits
Work of the US Gov. Public Use Permitted.
US-Patent-8,577,120 B1
Patent Application
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