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A Novel Instrument for the In-Situ Measurement of the Stress in Thin FilmsNo abstract available
Document ID
20140016822
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Broadway, David
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
December 1, 2014
Publication Date
April 28, 2014
Subject Category
Instrumentation And Photography
Report/Patent Number
M15-4152
Report Number: M15-4152
Meeting Information
Meeting: International Conference on Metallurgical Coatings and Thin Films
Location: San Diego, CA
Country: United States
Start Date: April 28, 2014
End Date: May 2, 2014
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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