Impact Induced Delamination Detection and Quantification With Guided Wavefield AnalysisThis paper studies impact induced delamination detection and quantification by using guided wavefield data and spatial wavenumber imaging. The complex geometry impact-like delamination is created through a quasi-static indentation on a CFRP plate. To detect and quantify the impact delamination in the CFRP plate, PZT-SLDV sensing and spatial wavenumber imaging are performed. In the PZT-SLDV sensing, the guided waves are generated from the PZT, and the high spatial resolution guided wavefields are measured by the SLDV. The guided wavefield data acquired from the PZT-SLDV sensing represent guided wave propagation in the composite laminate and include guided wave interaction with the delamination damage. The measured guided wavefields are analyzed through the spatial wavenumber imaging method, which generates an image containing the dominant local wavenumber at each spatial location. The spatial wavenumber imaging result for the simple single layer Teflon insert delamination provided quantitative information on delamination damage size and location. The location of delamination damage is indicated by the area with larger wavenumbers in the spatial wavenumber image. The impact-like delamination results only partially agreed with the damage size and shape. The results also demonstrated the dependence on excitation frequency. Future work will further investigate the accuracy of the wavenumber imaging method for real composite damage and the dependence on frequency of excitation.
Document ID
20150009468
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Tian, Zhenhua (South Carolina Univ. Columbia, SC, United States)
Leckey, Cara A. C. (NASA Langley Research Center Hampton, VA, United States)
Yu, Lingyu (South Carolina Univ. Columbia, SC, United States)
Seebo, Jeffrey P. (Analytical Mechanics Associates, Inc. Hampton, VA, United States)
Date Acquired
June 3, 2015
Publication Date
March 8, 2015
Subject Category
Aircraft Design, Testing And PerformanceComposite Materials
Report/Patent Number
NF1676L-19565
Meeting Information
Meeting: SPIE Smart Structures/NDE
Location: San Diego, CA
Country: United States
Start Date: March 8, 2015
End Date: March 12, 2015
Sponsors: International Society for Optical Engineering