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Designing the X-Ray Microcalorimeter Spectrometer for Optimal Science ReturnRecent advances in X-ray microcalorimeters enable a wide range of possible focal plane designs for the X-ray Microcalorimeter Spectrometer (XMS) instrument on the future Advanced X-ray Spectroscopic Imaging Observatory (AXSIO) or X-ray Astrophysics Probe (XAP). Small pixel designs (75 microns) oversample a 5-10" PSF by a factor of 3-6 for a 10 m focal length, enabling observations at both high count rates and high energy resolution. Pixel designs utilizing multiple absorbers attached to single transition-edge sensors can extend the focal plane to cover a significantly larger field of view, albeit at a cost in maximum count rate and energy resolution. Optimizing the science return for a given cost and/or complexity is therefore a non-trivial calculation that includes consideration of issues such as the mission science drivers, likely targets, mirror size, and observing efficiency. We present a range of possible designs taking these factors into account and their impacts on the science return of future large effective-area X-ray spectroscopic missions.
Document ID
20150018291
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
External Source(s)
Authors
Ptak, Andrew
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Bandler, Simon R.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Bookbinder, Jay
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Kelley, Richard L.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Petre, Robert
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Smith, Randall K.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Smith, Stephen
(Maryland Univ. Baltimore County Baltimore, MD, United States)
Date Acquired
September 24, 2015
Publication Date
September 26, 2013
Publication Information
Publication: Proceedings of SPIE
Publisher: SPIE
Volume: 8859
Subject Category
Astrophysics
Report/Patent Number
GSFC-E-DAA-TN26169
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
X-rays
spectroscopy
science metrics
astronomy
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