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Automated Detection of Anomalies in the Nondestructive Evaluation of Materials: Algorithms, Findings, and Next Steps This presentation describes efforts at NASA Langley Research Center to develop methodologies for autonomous detection of flaws in NDE (Nondestructive Evaluation) data.
Document ID
20170000694
Acquisition Source
Langley Research Center
Document Type
Presentation
Authors
Ambur, Manjula (NASA Langley Research Center Hampton, VA, United States)
Sammons, Daniel (NASA Langley Research Center Hampton, VA, United States)
Chen, Lin (NASA Langley Research Center Hampton, VA, United States)
Winfree, Bill (NASA Langley Research Center Hampton, VA, United States)
Burke, Eric (NASA Langley Research Center Hampton, VA, United States)
Howell, Patty (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
January 20, 2017
Publication Date
August 1, 2015
Subject Category
Chemistry And Materials (General)
Statistics And Probability
Quality Assurance And Reliability
Report/Patent Number
NF1676L-22382
Report Number: NF1676L-22382
Funding Number(s)
WBS: WBS 432938.08.01.07.01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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