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NASA Electronic Parts and Packaging (NEPP) Program, Discussion of Highly Accelerated Life Testing (HALT) of CapacitorsHighly Accelerated Life Testing (HALT) testing holds promise for affordable efficient acceptance testing of multi-layer ceramic chip capacitors (MLCCs) especially for commercial off the shelf (COTS).
Document ID
20170001452
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
External Source(s)
https://nepp.nasa.gov/
Authors
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Sampson, Michael J. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
February 8, 2017
Publication Date
February 2, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN64740
GSFC-E-DAA-TN39091
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
commercial parts
spaceflight applications
Highly Accelerated Life Testing (HALT)

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