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External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)In this presentation we will provide basic radiation effects on electronics, information on radiation effects and sources, a review of domestic SEE facilities and other radiation test facilities.
Document ID
20170002727
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Label, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
March 31, 2017
Publication Date
March 29, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN40074
Meeting Information
Meeting: Study on Space Radiation Effects Test Infrastructure (Electronics) Meeting
Location: Washington, DC
Country: United States
Start Date: March 29, 2017
End Date: March 31, 2017
Sponsors: National Academies Press
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
Space Environment
Radiation Test Facilities
Radiation Effects on Electronics

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