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Degradation and ESR Failures in MnO2 Chip Tantalum CapacitorsEquivalent series resistance (ESR) of chip tantalum capacitors determines the rate of energy delivery and power dissipation thus affecting temperature and reliability of the parts. Employment of advanced capacitors with reduced ESR decreases power losses and improves efficiency in power systems. Stability of ESR is essential for correct operations of power units and might cause malfunctioning and failures when ESR becomes too high or too low. Several cases with ESR values in CWR29 capacitors exceeding the specified limit that were observed recently raised concerns regarding environmental factors affecting ESR and the adequacy of the existing screening and qualification testing. In this work, results of stress testing of various types of military and commercial capacitors obtained over years by GSFC test lab and NEPP projects that involved ESR measurements are described. Environmental stress tests include testing in humidity and vacuum chambers, temperature cycling, long-term storage at high temperatures, and various soldering simulation tests. Note that in many cases parts failed due to excessive leakage currents or reduced breakdown voltages. However, only ESR-related degradation and failures are discussed. Mechanisms of moisture effect are discussed and recommendations to improve screening and qualification system are suggested.
Document ID
20170003492
Document Type
Presentation
Authors
Teverovsky, Alexander A. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
April 17, 2017
Publication Date
April 11, 2017
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN39787
Meeting Information
Annual CMSE Components for Military & Space Electronics Training & Exhibition 2017(Los Angeles, CA)
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Equivalent Series Resistance (ESR)
Degradation
Tantalum Capacitors

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