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Heavy Ion Test Report for the AD9364 RF TransceiverThe purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibility of the AD9364 from Analog Devices.
Document ID
20170009007
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Chen, Dakai (NASA Goddard Space Flight Center Greenbelt, MD United States)
Mondy, Tim (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Phan, Anthony (ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
September 26, 2017
Publication Date
January 1, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN44752
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
single event function interrupt (SEFI)
single-event effect (SEE)
single-event latchup (SEL)

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