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Recent Single Event Effects Compendium of Candidate Electronics for NASA Space SystemsWe present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Document ID
20180001346
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
O'Bryan, Martha V.
(MEI Technologies, Inc. Greenbelt, MD, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Pellish, Jonathan A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Lauenstein, Jean-Marie
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Chen, Dakai
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Marshall, Cheryl J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Oldham, Timothy R.
(Perot Systems Government Services Fairfax, VA, United States)
Kim, Hak S.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Phan, Anthony M.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Berg, Melanie D.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Campola, Michael J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sanders, Anthony B.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Marshall, Paul W.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Xapsos, Michael A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Raymond L.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Heidel, David F.
(International Business Machines Corp. Yorktown Heights, NY, United States)
Rodbell, Kenneth P.
(International Business Machines Corp. Yorktown Heights, NY, United States)
Swonger, Jim W.
(Peregrine Semiconductor Corp. Cocoa Beach,, FL, United States)
Alexander, Don
(Peregrine Semiconductor Corp. Cocoa Beach,, FL, United States)
Gauthier, Michael
(Centre National de la Recherche Scientifique Besancon, France)
Gauthier, Brian
(SEMICOA Corp. Costa Mesa, CA, United States)
Date Acquired
February 23, 2018
Publication Date
July 25, 2011
Publication Information
ISBN: 978-1-4577-1281-4
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
LEGNEW-OLDGSFC-GSFC-LN-1250
Meeting Information
Meeting: 2011 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2011)
Location: Las Vegas, NV
Country: United States
Start Date: July 25, 2011
End Date: July 29, 2011
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: IACRO 11-43951
CONTRACT_GRANT: IACRO 10-49771
Distribution Limits
Public
Copyright
Public Use Permitted.
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