Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Sood, Bhanu (NASA Goddard Space Flight Center Greenbelt, MD, United States) Date Acquired
May 16, 2019
Publication Date
May 14, 2019
Subject Category
Electronics And Electrical EngineeringQuality Assurance And Reliability Meeting Information
Meeting: Institute for Printed Circuits (IPC) High Reliability Forum
Location: Hanover, MD
Country: United States
Start Date: May 14, 2019
End Date: May 16, 2019
Sponsors: IPC - Association Connecting Electronics Industries
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
Destructive TechniquesFailure Analysis