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Advanced Silicon Avalanche Photodiodes on NASA's Global Ecosystem Dynamics Investigation (GEDI) MissionSilicon Avalanche Photodiodes (APDs) are used in NASA’s Global Ecosystem Dynamics Investigation (GEDI) which was launched in December 2018 and is currently measuring the Earth’s vegetation vertical structure from the International Space Station. The APDs were specially made for space lidar with a much lower hole-to-electron ionization coefficient ratio (k-factor ~0.008) than that of commercially available silicon APDs in order to reduce the APD excess noise from the randomness of the avalanche gain. A silicon heater resistor was used under the APD chip to heat the device up to 70°C and improve its quantum efficiency at 1064 nm laser wavelength while maintaining a low dark current such that the overall signal to noise ratio is improved. Special APD protection circuits were used to raise the overload damage threshold to prevent device damage from strong laser return by specular surfaces, such as still water bodies, and space radiation events. The APD and a hybrid transimpedance amplifier circuit were hermetically sealed in a package with a sufficiently low leak rate to ensure multi-year operation lifetime in space. The detector assemblies underwent a series of pre-launch tests per NASA Goddard Environmental Verification Standard for space qualification. They have performed exactly as expected with GEDI in orbit. A detailed description of the GEDI detector design, signal and noise model, and test results are presented in this paper.

Document ID
20200001052
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Sun, Xiaoli
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Blair, J. Bryan
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Bufton, Jack L.
(Global Science and Technology, Inc. Greenbelt, MD, United States)
Marcela Faina
(Excelitas Technologies Vaudreuil-Dorion, QC, Canada)
Sigrid Dahl
(Excelitas Technologies Vaudreuil-Dorion, QC, Canada)
Berard, Philippe
(Excelitas Technologies Vaudreuil-Dorion, QC, Canada)
Seymour, Richard J.
(Excelitas Technologies Vaudreuil-Dorion, QC, Canada)
Date Acquired
February 20, 2020
Publication Date
February 1, 2020
Subject Category
Geosciences (General)
Report/Patent Number
GSFC-E-DAA-TN77205
Meeting Information
Meeting: SPIE Photonics West
Location: San Francisco, CA
Country: United States
Start Date: February 1, 2020
End Date: February 6, 2020
Sponsors: International Society for Optical Engineering
Funding Number(s)
CONTRACT_GRANT: NNG11HP16A
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
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