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Space Induced Discharge Model to Be Used on Interface Circuit Vulnerability Assessment
External Source
jpl
Document Type
Preprint
Authors
Wong, Kit Pui F.
Chinn, James Z.
Kim, Wousik
Xie, Julie
Date Acquired
February 10, 2024
Publication Date
January 3, 2022
Publication Information
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2022
DOI: http://hdl.handle.net/2014/56094
Distribution Limits
Public

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