Single-Event Burnout Mechanisms in SiC Power MOSFETs

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Date Acquired

November 7, 2026

Publication Information

Publication: IEEE Transactions on Nuclear Science

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Volume: 65

Issue: 8

Issue Publication Date: August 1, 2018

ISSN: 0018-9499

e-ISSN: 1558-1578

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Public

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