NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
THICKNESS DETERMINATION OF THIN FILMS BY THE EVAPORATION METHOD. TECHNICAL COMMENTThickness determination of thin films by the evaporation method
Document ID
19620002874
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Modisette, J. L.
Date Acquired
August 1, 2013
Publication Date
January 1, 1962
Subject Category
Navigation
Accession Number
62N12874
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
THIN FILM
EVAPORATION
Document Inquiry

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available