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A Method for Measuring the Spectral Normal Emittance in Air of A Variety of Materials Having Stable Emittance CharacteristicsA method and apparatus is described for the measurement of spectral normal emittance in air of a variety of materials. The system permits measurements to be performed over a wavelength region of 1.0 through 15.0 microns and over a temperature range of 600F to 1,8000F with an accuracy of 5.0 percent. The advantages of this system are described. Results obtained by this system are compared with results reported by another observer using a different technique.
Document ID
19620002966
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Slemp, Wayne S. (NASA Langley Research Center Hampton, VA, United States)
Wade, William R. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 1, 2013
Publication Date
January 1, 1962
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Symposium on Measurement of Thermal Radiation Properties of Solids
Location: Dayton, OH
Country: United States
Start Date: September 5, 1962
End Date: September 7, 1962
Sponsors: Aeronautical Systems Div., NASA Headquarters, National Bureau of Standards
Accession Number
62N12966
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
COATING
HEAT TRANSFER
CERMET
SPECTRAL EMISSION
CERAMICS

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