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Capacitance extensometers for microstrain measurements.Fielden proximity meter and wayne kerr electronic micrometer for detecting small capacitance changes for microstrain measurements
Document ID
19640025599
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Bresie, D. A.
Hartman, D. E.
Roberts, J. M.
Date Acquired
August 2, 2013
Publication Date
November 1, 1963
Subject Category
Machine Elements And Processes
Accession Number
64A11492
Funding Number(s)
CONTRACT_GRANT: NSG-6-59
Distribution Limits
Public
Copyright
Other
Keywords
EXTENSOMETER
STRAIN GAUGE

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