NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Microwave technique measures plasma characteristicsPlasma electron density and temperature distribution are measured by passing a high frequency millimeter wave through plasma. Variations in density and temperature are determined by measuring insertion loss as the plasma travels between the microwave transmitting and receiving antennas.
Document ID
19650000121
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Leonard, W. F.
Date Acquired
August 2, 2013
Publication Date
April 1, 1965
Subject Category
Physical Sciences
Report/Patent Number
LAR-134
Report Number: LAR-134
Accession Number
65B10122
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available