NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Testing device subjects elastic materials to biaxial deformationsTesting device stretches elastic materials biaxially over large deformation ranges and varies strain ratios in two perpendicular directions. The device is used in conjunction with a tensile testing machine, which holds the specimen and permits control over the direction and magnitude of the stresses applied.
Document ID
19650000187
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Becker, G. W.
Date Acquired
August 2, 2013
Publication Date
June 1, 1965
Subject Category
Materials
Report/Patent Number
JPL-616
Report Number: JPL-616
Accession Number
65B10189
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available