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Electrical probe ensures reliable contact in socketSpring-loaded probe makes a reliable electrical contact by producing a circular wiping motion at the tip when inserted into a mating socket.
Document ID
19650000213
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 2, 2013
Publication Date
July 1, 1965
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-315
Report Number: MFS-315
Accession Number
65B10215
Funding Number(s)
CONTRACT_GRANT: NAS8-11561
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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