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Novel probe simplifies electronic component testingTest probe, in conjunction with standard equipment, tests axial-lead electronic components in their original packages. The probe can be modified to test any electronic component with automatic or nonautomatic equipment.
Document ID
19650000241
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Syner, W. F.
Date Acquired
August 2, 2013
Publication Date
August 1, 1965
Subject Category
Electronic Components And Circuits
Report/Patent Number
GSC-342
Report Number: GSC-342
Accession Number
65B10243
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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