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Microelectronics research on silicon-silicon oxide structures and interfaces third quarterly report, 1 dec. 1964 - 28 feb. 1965Electron microscopy calculations in minimum and maximum capacitance theories for silicon-silicon oxide structures and interfaces
Document ID
19650012159
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
August 2, 2013
Publication Date
February 28, 1965
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-CR-62259
Report Number: NASA-CR-62259
Accession Number
65N21760
Funding Number(s)
CONTRACT_GRANT: NAS8-11235
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
SILICON OXIDE
CAPACITANCE
ELECTRON MICROSCOPY
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